Surface Topography SEM

The topography of a surface is known to substantially affect the bulk properties of a material. Many times there is nanoscale morphology in surface anomalies and a desired interest in their resultant influence. This surface topography is mainly investigated and observed by microscopic measurements.

The characterization of surface topography has become increasingly important in many fields and through the increasing resolution and simplification of microscopic devices, such as SEM, (scanning electron microscopy), the move from sophisticated and dedicated operations to a benchtop, user friendly device has transformed the industry.

Best of Both Worlds:

The Phenom World Desktop Scanning Electron Microscope (SEM) product line was engineered from scratch not only to create the most versatile instrument to match the demand of an increasingly competitive scientific community, but to also create the most fulfilling experience for the user.

One unique feature of the Phenom SEM products is the standard Backscatter Electron Detector (BSD). This allows the user to analyze both the topological and elemental characteristics of the sample in addition to several other post process analyses such as 3D surface reconstruction, pore size, particle size, and fiber analysis.

Phenom SEM Technology:

The Phenom: World’s Fastest Desktop Scanning Electron Microscope:

With its market-leading Phenom desktop Scanning Electron Microscope (SEM), Phenom-World helps customers to stay competitive in a world where critical dimensions are continuously getting smaller. All Phenom desktop systems give direct access to the high-resolution and high-quality imaging and analysis required in a large variety of applications. They are affordable, flexible and a fast tool enabling engineers, technicians, researchers and educational professionals to investigate micron and submicron structures.

Phenomenal Imaging and Analysis Power:

  • Imaging power up to 130,000x magnification
  • Unmatched ease of use by intuitive system control
  • Fully integrated X-ray analysis
  • Fastest time from loading sample to SEM image (< 30 sec) by using an integrated X, Y motor stage
  • “Never lost” navigation by combination of optical navigation camera and low magnification SEM imaging

Phenom Markets & Applications:

From Biological Development to Pharmaceutics:

The Phenom is a perfect tool for investigating mold spores or analyzing pharmaceutical powders. A vast variety of sample holders allows biological and pharmaceutical sample analysis without difficult sample preparation.

From Process Control to Quality Assurance:

The Phenom desktop SEM is the ideal tool for processing samples and evaluating quality in a short span of time. The rapid sample preparation and the incredibly short feedback time improve the efficiency and effectiveness of the failure analysis.

From Material Characterization to Metallurgy Analysis:

The Phenom allows operators to perform microstructural analysis and non-destructive testing of metals to identify variations that occur after treatment, and to determine compositional contrast.

All-round Forensic Investigation:

The Phenom is used to perform ballistic research, identify scratches and indents from tool marks,human and animal hair classification or scrutinizing residues such as sand and diatoms.

Phenom Desktop SEM:

The Phenom desktop SEM is equipped with a long lifetime, high brightness CeB6-source. This allows the user to create state-of-the-art images with a minimum of maintenance intervention. The Phenom Pure is an ideal tool for the transition from light optical to electron microscopes. It is the most economical solution for high resolution imaging, providing the best imaging results in its class.

Phenom XL:

  • Fastest vent/load cycle in the world

  • The desktop SEM for large samples and automation
  • Motorized scan of samples up to 10mm x 100mm

Phenom ProX:

  • The high-performance desktop SEM
  • Magnification range up to 150,000
  • Fully integrated EDS solution
  • Optional SED

Phenom Pro:

  • Magnification range up to 150,000x

  • Fast and excellent imaging on a desktop SEM
  • Between 5 kV and 15 k V acceleration voltages for the best resolution on a large variety of samples

Phenom Pure:

  • Basic SEM for high resolution images
  • Magnification range up to 30,000x

Phenom Software Applications:

Automated and Market-Specific Software Solutions:

The Phenom ProSuite has been developed to enable Phenom users to extract maximum information from images made with the Phenom desktop Scanning
Electron Microscope (SEM). The software is installed on a monitor-mounted PC, leaving the Phenom imaging unit in its original state and guaranteeing maximum system stability.

SEM Sample Holders:

Large Variety of Sample-Loading Accessories:

For all Phenom desktop SEM a large variety of sample holders is available in order to extend the sample application range.
These holders are designed for optimizing sample loading speed and guarantee the fastest time to image available in the market. In addition to the sample holders, Phenom-World has two inserts for specific sample types. These inserts enable fast sample preparation and speed up the sample throughput times.

Standard Sample Holders & Inserts:

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    Standard Sample Holder

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    Charge Reduction Sample Holder

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    Metallurgical Sample Holder

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    Metallurgical Charge Reduction Sample Holder

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    Micro-Tool Sample Holder

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    X-view Insert*

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    Micro-Electronics Insert*

* Requires Metallurgical Sample Holder or Metallurgical Charge Reduction Sample Holder

Active Sample Holders:

Motorized Tilt & Rotation Sample Holder:

• Continuous 360° compucentric rotation

• Tilt range -10° to +45°

• Tilt adapted focus

• Controlled by dedicated Motion Control

Temperature Controlled Sample Holder

• Temperature range -25°C to +50°C

• Temperature accuracy ±1.5°C

• Maximum cooling rate 20°C/min

• Water-cooled by a self contained closed-loop water chiller box